publications

Publications in international and domestic journals listed in reverse chronological order

2026

  1. A Spatio-Temporal Gaussian Process with Change-Points for Image-Based Degradation Data
    M. Lim*, and S. J. Bae
    IISE Transactions, 2026
  2. AI-Guided 4D Printing of Carnivorous Plants-Inspired Microneedles for Accelerated Wound Healing
    H. Lee, M. -J. Kim, D. Kim, and 19 more authors
    Advanced Materials, 2026

2025

  1. A Nonlinear Quantile Regression for Accelerated Destructive Degradation Testing Data
    S. J. Bae, and M. Lim*
    IISE Transactions, 2025

2024

  1. Depth-Based Condition Monitoring and Anomaly Contribution Analysis for Combined Cycle Power Plant
    M. Lim*, Y. H. Kim, S. X. Jin, and 8 more authors
    IEEE Access, 2024
  2. User Experience Data-Based Quality Evaluation for Micro Electric Vehicle Mobility Services
    M. Lim*, Y. Kim, D. Jeon, and 5 more authors
    Journal of Korean Society for Quality Management, 2024

2023

  1. Fault classification via energy features of two-dimensional image data
    M. Lim*, B. Vidakovic, and S. J. Bae
    Communications in Statistics-Theory and Methods, 2023
  2. Energy Feature-based Anomaly Detection for Network Traffic Signal Data
    J. S. Lee, M. Lim*, and S. J. Bae
    Journal of Applied Reliability, 2023

2022

  1. Life Prediction of Membrane Electrode Assembly through Load and Potential Cycling Accelerated Degradation Testing in Polymer Electrolyte Membrane Fuel Cells
    S. R. Choi, M. Lim*, D. Y. Kim, and 6 more authors
    International Journal of Hydrogen Energy, 2022
  2. Lifetime Estimation of Electric Transformers for Multiple Failure-Modes
    M. Lim*, J. H. Lee, G. H. Park, and 1 more author
    Journal of Applied Reliability, 2022

2021

  1. Reliability Analysis of Accelerated Destructive Degradation Testing Data for Bi-functional DC Motor Systems
    C. Lee, M. Lim*, C. Kim, and 1 more author
    Applied Sciences-Basel, 2021

2020

  1. Condition Monitoring Scheme via One-Class Support Vector Machine and Multivariate Control Charts
    B. M. Mun, M. Lim*, and S. J. Bae
    Journal of Mechanical Science and Technology, 2020
  2. A Step-Down Test Procedure for Wavelet Shrinkage Using Bootstrapping
    M. Lim*, O. A. Omitaomu, and S. J. Bae
    IEEE Access, 2020

2019

  1. Spatial Monitoring of Wafer Map Defect Data Based on 2D Wavelet Spectrum Analysis
    M. Lim*, and S. J. Bae
    Applied Sciences-Basel, 2019
  2. Fault Detection and Diagnosis of Smart Factory Equipments Using Wavelet Spectrum
    B. M. Mun, M. Lim*, S. -J. Kim, and 1 more author
    Journal of Applied Reliability, 2019